{"categories":[],"version":"1.0","height":"190","published":"2017-02-11 04:27:45","author_name":"dakusui","type":"rich","provider_name":"Hatena Blog","width":"100%","url":"https://jcunit.hatenablog.jp/entry/2017/02/11/042745","provider_url":"https://hatena.blog","blog_title":"jcunit's blog","html":"<iframe src=\"https://hatenablog-parts.com/embed?url=https%3A%2F%2Fjcunit.hatenablog.jp%2Fentry%2F2017%2F02%2F11%2F042745\" title=\"IEEE International Conference on Software Testing 2017\u3067JCUnit\u306e\u767a\u8868\u3092\u3059\u308b\u3053\u3068\u306b\u306a\u308a\u307e\u3057\u305f\u3002 - jcunit&#39;s blog\" class=\"embed-card embed-blogcard\" scrolling=\"no\" frameborder=\"0\" style=\"display: block; width: 100%; height: 190px; max-width: 500px; margin: 10px 0px;\"></iframe>","description":"\u8868\u984c\u306e\u901a\u308a\u3067\u3059\u3002\u30b9\u30b1\u30b8\u30e5\u30fc\u30eb\u306f\u3053\u3061\u3089\u3002 ICST 2017 | Schedule \u6771\u4eac\u3067\u958b\u50ac\u3055\u308c\u308b\u30ab\u30f3\u30d5\u30a1\u30ec\u30f3\u30b9\u306a\u306e\u306b\u3001\u65e5\u672c\u4eba\u306e\u767a\u8868\u8005\u304c\u3042\u307e\u308a\u898b\u5f53\u305f\u3089\u306a\u3044\u306e\u306f\u6b8b\u5ff5\u306a\u3053\u3068\u3067\u3059\u3002 2/13\u307e\u3067\u306fEarly Bird\u3067\u5c11\u3057\u3060\u3051\u304a\u5b89\u304f\u304a\u7533\u3057\u8fbc\u307f\u3067\u304d\u307e\u3059\u3002 ICST 2017 | Registration \u30ad\u30fc\u30ce\u2212\u30c8\u30b9\u30d4\u30fc\u30c1\u7b49\u306f\u540c\u6642\u901a\u8a33\u3082\u3064\u304f\u305d\u3046\u3067\u3059\u3002","title":"IEEE International Conference on Software Testing 2017\u3067JCUnit\u306e\u767a\u8868\u3092\u3059\u308b\u3053\u3068\u306b\u306a\u308a\u307e\u3057\u305f\u3002","blog_url":"https://jcunit.hatenablog.jp/","image_url":null,"author_url":"https://blog.hatena.ne.jp/dakusui/"}