{"width":"100%","categories":["\u5de5\u4f5c"],"author_name":"kurosakiworks","version":"1.0","html":"<iframe src=\"https://hatenablog-parts.com/embed?url=https%3A%2F%2Fkuroworks.hatenadiary.jp%2Fentry%2F2024%2F12%2F03%2F114509\" title=\"Kapton\u306e\u5149\u306e\u900f\u904e\u306e\u30e1\u30e2 - \u30bf\u30a4\u30c8\u30eb\u306f\u305d\u306e\u3046\u3061\u6c7a\u3081\u308b\" class=\"embed-card embed-blogcard\" scrolling=\"no\" frameborder=\"0\" style=\"display: block; width: 100%; height: 190px; max-width: 500px; margin: 10px 0px;\"></iframe>","title":"Kapton\u306e\u5149\u306e\u900f\u904e\u306e\u30e1\u30e2","provider_name":"Hatena Blog","blog_url":"https://kuroworks.hatenadiary.jp/","provider_url":"https://hatena.blog","url":"https://kuroworks.hatenadiary.jp/entry/2024/12/03/114509","height":"190","author_url":"https://blog.hatena.ne.jp/kurosakiworks/","blog_title":"\u30bf\u30a4\u30c8\u30eb\u306f\u305d\u306e\u3046\u3061\u6c7a\u3081\u308b","description":"50\u03bcm\u539a\u306eKapton E\u306b\u3064\u3044\u3066\u3002 450nm\u4ee5\u4e0b\u304c\u307b\u307c\u900f\u904e\u3057\u306a\u304f\u3066\u3001\u3086\u308b\u3063\u3068\u7acb\u3061\u4e0a\u304c\u3063\u3066600nm\u3042\u305f\u308a\u3067\u306a\u307e\u3063\u3066\u304d\u3066800nm\u3042\u305f\u308a\u3067\u900f\u904e\u73870.8\u304f\u3089\u3044\u3002 K. Long, A. Z. Kattamis, I. . -C. Cheng, H. Gleskova, S. Wagner and J. C. Sturm, \"Stability of amorphous-silicon TFTs deposited on clear plastic substrates at 250\u00b0C to 280\u00b0C\" in IEEE Electron Device Letters, vol. 27, n\u2026","published":"2024-12-03 11:45:09","type":"rich","image_url":"https://cdn.blog.st-hatena.com/images/theme/og-image-1500.png"}