{"height":"190","version":"1.0","categories":["ICST2017","\u52c9\u5f37\u4f1a","\u6280\u8853"],"type":"rich","title":"#ICST2017 \u57fa\u8abf\u8b1b\u6f14\u300cThe State of Continuous Integration Testing at Google\u300d\u8074\u8b1b\u30ec\u30dd\u30fc\u30c8","url":"https://nihonbuson.hatenadiary.jp/entry/2017/03/20/173000","author_url":"https://blog.hatena.ne.jp/nihonbuson/","author_name":"nihonbuson","blog_url":"https://nihonbuson.hatenadiary.jp/","html":"<iframe src=\"https://hatenablog-parts.com/embed?url=https%3A%2F%2Fnihonbuson.hatenadiary.jp%2Fentry%2F2017%2F03%2F20%2F173000\" title=\"#ICST2017 \u57fa\u8abf\u8b1b\u6f14\u300cThe State of Continuous Integration Testing at Google\u300d\u8074\u8b1b\u30ec\u30dd\u30fc\u30c8 - \u30d6\u30ed\u30c3\u30b3\u30ea\u30fc\u306e\u30d6\u30ed\u30b0\" class=\"embed-card embed-blogcard\" scrolling=\"no\" frameborder=\"0\" style=\"display: block; width: 100%; height: 190px; max-width: 500px; margin: 10px 0px;\"></iframe>","provider_url":"https://hatena.blog","width":"100%","published":"2017-03-20 17:30:00","blog_title":"\u30d6\u30ed\u30c3\u30b3\u30ea\u30fc\u306e\u30d6\u30ed\u30b0","description":"\u306f\u3058\u3081\u306b ICST2017\u306e\u4e2d\u3067\u3001\u300cThe State of Continuous Integration Testing at Google\u300d\u3068\u3044\u3046\u30bf\u30a4\u30c8\u30eb\u3067Google\u306e\u30a8\u30f3\u30b8\u30cb\u30a2\u3067\u3042\u308bJohn Micco\u3055\u3093\u304c\u57fa\u8abf\u8b1b\u6f14\u3092\u884c\u3044\u307e\u3057\u305f\u3002 ICST2017\u516c\u5f0f\u30da\u30fc\u30b8 ICST 2017 | 10th IEEE International Conference on Software Testing, Verification and Validation \u767a\u8868\u30b9\u30e9\u30a4\u30c9 http://aster.or.jp/conference/icst2017/program/jmicco-keynote.p\u2026","provider_name":"Hatena Blog","image_url":null}